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100   $a20160421d2012      ua         0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aIREX III $espuulement I : failure analysis /$fG. W. Quinn; P. Grother
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2012.
215   $a1 online resource
225 1 $aNISTIR ;$v7853
300   $a2012.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aIREX III
700   $aQuinn$b George W$c(Of the National Institute of Standards and Technology)$01397259
701   $aGrother$b Patrick J$01385097
712 02$aInformation Technology Laboratory (National Institute of Standards and Technology).$bInformation Access Division.
801  0$bNBS
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996   $aIREX III$94199441
997   $aUNINA