LEADER 01312aam 2200373I 450 001 9910710754303321 005 20160421112348.0 024 8 $aGOVPUB-C13-aa2da811054c269035dedeb6707f5d4f 035 $a(CKB)5470000002478764 035 $a(OCoLC)947049536 035 $a(EXLCZ)995470000002478764 100 $a20160421d2008 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aOperational measures and accuracies of ROC curve on large fingerprint data sets /$fJin Chu Wu 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2008. 215 $a1 online resource 225 1 $aNISTIR ;$v7495 300 $a2008. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aWu$b Jin Chu$01391473 701 $aWu$b Jin Chu$01391473 712 02$aNational Institute of Standards and Technology (U.S.) 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710754303321 996 $aOperational measures and accuracies of ROC curve on large fingerprint data sets$93445271 997 $aUNINA