LEADER 01702aam  2200445I  450 
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005 20160421112349.0
024 8 $aGOVPUB-C13-20db8da4052c5d3e2059f0c9b6a6df1c
035   $a(CKB)5470000002478772
035   $a(OCoLC)947049559
035   $a(EXLCZ)995470000002478772
100   $a20160421d2008      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aExtending the notion of quality from physical metrology to information and sustainability /$fGaurav Ameta; Sudarsan Rachuri; Xenia Fiorentini; Mahesh Mani; Steven J. Fenves; Kevin W. Lyons; Ram D. Sriram
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2008.
215   $a1 online resource
225 1 $aNISTIR ;$v7517
300   $a2008.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aAmeta$b Gaurav$01392240
701   $aAmeta$b Gaurav$01392240
701   $aFenves$b Steven J$g(Steven Joseph)$030896
701   $aFiorentini$b Xenia$01388800
701   $aLyons$b Kevin W$01390360
701   $aMani$b Mahesh$01388803
701   $aRachuri$b Sudarsan$01388804
701   $aSriram$b Ram D$01390362
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710753503321
996   $aExtending the notion of quality from physical metrology to information and sustainability$93538338
997   $aUNINA