LEADER 01361aam  2200397I  450 
001 9910710752603321
005 20160421112350.0
024 8 $aGOVPUB-C13-6577825729251b27c359949b1c44604d
035   $a(CKB)5470000002478781
035   $a(OCoLC)947049570
035   $a(EXLCZ)995470000002478781
100   $a20160421d2008      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aBiometric quality $ethe last 1% : biometric quality assessment for error suppression /$fElham Tabassi; Patrick Grother
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2008.
215   $a1 online resource
225 1 $aNISTIR ;$v7544
300   $a2008.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aBiometric quality 
700   $aTabassi$b Elham$01387959
701   $aGrother$b Patrick J$01385097
701   $aTabassi$b Elham$01387959
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710752603321
996   $aBiometric quality$93461320
997   $aUNINA