LEADER 01898aam 2200517I 450 001 9910710750203321 005 20160421112351.0 024 8 $aGOVPUB-C13-1a8d803ae7e19212415f1ef9192b3628 035 $a(CKB)5470000002478805 035 $a(OCoLC)947049619 035 $a(EXLCZ)995470000002478805 100 $a20160421d2009 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aOverview of the multiple biometrics grand challenge /$fP. J. Phillips; H. A. Sahibzada; P. J. Flynn; K. W. Bowyer; A. O'Toole; S. Weimer; J. R. Beveridge; B. Draper; D. Bolme; G. H. Givens; Y. M. Lui; J. A. Scallan; W. T. Scruggs 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2009. 215 $a1 online resource 225 1 $aNISTIR ;$v7607 300 $a2009. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aPhillips$b P. J$01394690 701 $aBeveridge$b J. R$01395780 701 $aBolme$b D$01410207 701 $aBowyer$b K. W$01411664 701 $aDraper$b B$01410208 701 $aFlynn$b P. J$g(Patrick J.)$05977 701 $aGivens$b Geof H$0298415 701 $aLui$b Y. M$01395783 701 $aO'Toole$b A$01411665 701 $aPhillips$b P. J$01394690 701 $aSahibzada$b H. A$01395784 701 $aScallan$b J. A$01411666 701 $aScruggs$b W. T$01411667 701 $aWeimer$b S$01394692 712 02$aNational Institute of Standards and Technology (U.S.) 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710750203321 996 $aOverview of the multiple biometrics grand challenge$93503394 997 $aUNINA