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005 20160421112351.0
024 8 $aGOVPUB-C13-2efbaa795bb335516b570c9ab93daec9
035   $a(CKB)5470000002478833
035   $a(OCoLC)947049665
035   $a(EXLCZ)995470000002478833
100   $a20160421d2010      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 12$aA collection of 2D elliptic problems for testing adaptive algorithms /$fWilliam F. Mitchell
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2010.
215   $a1 online resource
225 1 $aNISTIR ;$v7668
300   $a2010.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aMitchell$b William F$0127031
701   $aMitchell$b William F$0127031
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710747403321
996   $aA collection of 2D elliptic problems for testing adaptive algorithms$93448658
997   $aUNINA