LEADER 01529aam 2200409I 450 001 9910710741903321 005 20160421112352.0 024 8 $aGOVPUB-C13-335eac677d26cec5fd335c9e16e378f8 035 $a(CKB)5470000002478889 035 $a(OCoLC)947049736 035 $a(EXLCZ)995470000002478889 100 $a20160421d2011 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aEmpirical evidence for increased false reject rate with time lapse in ICE 2006 /$fS. E. Baker; K. W. Bowyer; P. J. Flynn; P. J. Phillips 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2011. 215 $a1 online resource 225 1 $aNISTIR ;$v7752 300 $a2011. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aBaker$b S. E$01420459 701 $aBaker$b S. E$01420459 701 $aBowyer$b K. W$01411664 701 $aFlynn$b P. J$05977 701 $aPhillips$b P. J$01394690 712 02$aInformation Technology Laboratory (National Institute of Standards and Technology).$bInformation Access Division. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710741903321 996 $aEmpirical evidence for increased false reject rate with time lapse in ICE 2006$93538333 997 $aUNINA