LEADER 01564aam 2200409I 450 001 9910710735403321 005 20160421112356.0 024 8 $aGOVPUB-C13-7ee8b71fb9e06c22f97bc791ed524d4b 035 $a(CKB)5470000002478955 035 $a(OCoLC)947049840 035 $a(EXLCZ)995470000002478955 100 $a20160421d2014 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aMeasurement uncertainties of three score distributions and two thresholds with data dependency /$fJin Chu Wu; Alvin F. Martin; Craig S. Greenberg; Raghu N. Kacker 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2014. 215 $a1 online resource 225 1 $aNISTIR ;$v8025 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aSeptember 2014. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aWu$b Jin Chu$01391473 701 $aGreenberg$b Craig S$01398286 701 $aKacker$b Raghu N$01387243 701 $aMartin$b Alvin F$01394685 701 $aWu$b Jin Chu$01391473 712 02$aInformation Technology Laboratory (National Institute of Standards and Technology) 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710735403321 996 $aMeasurement uncertainties of three score distributions and two thresholds with data dependency$93461313 997 $aUNINA