LEADER 01354aam  2200397I  450 
001 9910710583103321
005 20160426110500.0
024 8 $aGOVPUB-C13-6c8ff26cfd302271335c336f209205c2
035   $a(CKB)5470000002477463
035   $a(OCoLC)947843879
035   $a(EXLCZ)995470000002477463
100   $a20160426d1984      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aTERRY-2 $ea test chip for characterization of the performance of buried-channel Charge-Coupled Device (CCD) imagers /$fG. P. Carver; R. A. Wachnik
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1984.
215   $a1 online resource
225 1 $aNBSIR ;$v84-2894
300   $a1984.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aTERRY-2 
700   $aCarver$b G. P$01385516
701   $aCarver$b G. P$01385516
701   $aWachnik$b R. A$01400391
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710583103321
996   $aTERRY-2$93467215
997   $aUNINA