LEADER 01409aam  2200397I  450 
001 9910710569603321
005 20160426110502.0
024 8 $aGOVPUB-C13-2c0d1c3e716b50d5e827e7272a7762e3
035   $a(CKB)5470000002477599
035   $a(OCoLC)947844069
035   $a(EXLCZ)995470000002477599
100   $a20160426d1988      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aSystem for measuring optical waveguide intensity profiles /$fLee E. Larson; Donald R. Larson; Robert J. Phelan
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1988.
215   $a1 online resource
225 1 $aNBSIR ;$v88-3092
300   $a1988.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aLarson$b L. E$g(Lee E.)$01399976
701   $aLarson$b Donald R$01398311
701   $aLarson$b L. E$g(Lee E.)$01399976
701   $aPhelan$b Robert J$01399977
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710569603321
996   $aSystem for measuring optical waveguide intensity profiles$93466214
997   $aUNINA