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005 20160606093149.0
024 8 $aGOVPUB-C13-473977f7658cd07fa85f1cb7d62a81cd
035   $a(CKB)5470000002477810
035   $a(OCoLC)951215451
035   $a(EXLCZ)995470000002477810
100   $a20160606d1986      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aStability of some epoxy-encapsulated diode thermometers /$fB. W. Mangum; G. A. Evans
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1986.
215   $a1 online resource
225 1 $aNBSIR ;$v86-3337
300   $a1986.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aMangum$b B. W$01391858
701   $aEvans$b G. A., Jr$01415572
701   $aMangum$b B. W$01391858
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710548703321
996   $aStability of some epoxy-encapsulated diode thermometers$93518001
997   $aUNINA