LEADER 01790aam  2200493I  450 
001 9910710526703321
005 20160922100248.0
024 8 $aGOVPUB-C13-771d966f43db1a1983d955168a8e5200
035   $a(CKB)5470000002478032
035   $a(OCoLC)958933660
035   $a(EXLCZ)995470000002478032
100   $a20160922d2001      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aAnalysis of dimensional metrology standards /$fJohn Evans; Simon Frechette; John Horst; Hui Huang; Thomas Kramer; Elena Messina; Fred Proctor; Bill Rippey; Harry Scott; Ted Vorburger; Al Wavering
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2001.
215   $a1 online resource
225 1 $aNISTIR ;$v6847
300   $a2001.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aEvans$b John$0386732
701   $aEvans$b John$0386732
701   $aFrechette$b Simon$01392970
701   $aHorst$b John$01388778
701   $aHuang$b Hui$01390717
701   $aKramer$b Thomas$0734416
701   $aMessina$b E. R$g(Elena R.)$0285819
701   $aProctor$b Frederick M$01383414
701   $aRippey$b Bill$01414661
701   $aScott$b Harry$01390715
701   $aVorburger$b Ted$01414662
701   $aWavering$b Al$01414663
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710526703321
996   $aAnalysis of dimensional metrology standards$93514559
997   $aUNINA