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005 20160705110709.0
024 8 $aGOVPUB-C13-20abe8b80c366b9cf48de909e87b602e
035   $a(CKB)5470000002478140
035   $a(OCoLC)953032892
035   $a(EXLCZ)995470000002478140
100   $a20160705d1988      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aXRAYL $ea powder diffraction profile refinement program /$fC. R. Hubbard; J. M. Stewart; Y. Zhang; B. Morosin; E. L. Venturini
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1988.
215   $a1 online resource
225 1 $aNISTIR ;$v88-3850
300   $a1988.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aXRAYL 
700   $aHubbard$b C. R$01391464
701   $aHubbard$b C. R$01391464
701   $aMorosin$b B$01395120
701   $aStewart$b JM$01245661
701   $aVenturini$b E. L$01395121
701   $aZhang$b Y$01395122
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710516003321
996   $aXRAYL$93453127
997   $aUNINA