LEADER 01333aam 2200385I 450 001 9910710285803321 005 20160121100808.0 024 8 $aGOVPUB-C13-ec5b7b001c160a518806a3a1a8a9fcc9 035 $a(CKB)5470000002476425 035 $a(OCoLC)935499121 035 $a(EXLCZ)995470000002476425 100 $a20160121d1979 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aImage pattern recognition in industrial inspection /$fGordon J. Vanderbrug; Roger N. Nagel 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1979. 215 $a1 online resource 225 1 $aNBSIR ;$v79-1764 300 $a1979. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aVanderbrug$b Gordon J$01412643 701 $aNagel$b Roger N$01388970 701 $aVanderbrug$b Gordon J$01412643 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710285803321 996 $aImage pattern recognition in industrial inspection$93506817 997 $aUNINA