LEADER 01386aam  2200397I  450 
001 9910710278503321
005 20160121100808.0
024 8 $aGOVPUB-C13-302c2a1ee4d0cf7159615c2a298a0d68
035   $a(CKB)5470000002476499
035   $a(OCoLC)935499524
035   $a(EXLCZ)995470000002476499
100   $a20160121d1981      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aLaser scanning measurements on solar cell test pattern NBS-22 /$fW. F. Lankford; P. Kowalski; H. A. Schafft
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1981.
215   $a1 online resource
225 1 $aNBSIR ;$v81-2260
300   $a1981.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aLankford$b W. F$01394673
701   $aKowalski$b P$01418515
701   $aLankford$b W. F$01394673
701   $aSchafft$b H. A$01394674
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710278503321
996   $aLaser scanning measurements on solar cell test pattern NBS-22$93530199
997   $aUNINA