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001 9910710277503321
005 20160121100808.0
024 8 $aGOVPUB-C13-d46e551cdfb2c4f96ac10db2f70fb60e
035   $a(CKB)5470000002476509
035   $a(OCoLC)935499584
035   $a(EXLCZ)995470000002476509
100   $a20160121d1981      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$a1980 annual report $eelectric and magnetic field measurements /$fRonald H. McKnight; F. R. Kotter; M. Misakian; P. Ortiz
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1981.
215   $a1 online resource
225 1 $aNBSIR ;$v81-2267
300   $a1981.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $a1980 annual report 
700   $aMcKnight$b R. H$g(Ronald H.)$01393537
701   $aKotter$b F. R$01404794
701   $aMcKnight$b R. H$g(Ronald H.)$01393537
701   $aMisakian$b M$01388192
701   $aOrtiz$b P$01412642
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710277503321
996   $a1980 annual report$93506816
997   $aUNINA