LEADER 01521aam  2200433I  450 
001 9910710277303321
005 20160121100809.0
024 8 $aGOVPUB-C13-6fa47194b219098fe19d7707c248e528
035   $a(CKB)5470000002476511
035   $a(OCoLC)935499618
035   $a(EXLCZ)995470000002476511
100   $a20160121d1981      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$a1980 annual report $eoptical measurements for interfacial conduction and breakdown /$fR. E. Hebner Jr.; E. F. Kelley; J. E. Thompson; T. S. Sudarshan; T. B. Jones
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1981.
215   $a1 online resource
225 1 $aNBSIR ;$v81-2275
300   $a1981.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $a1980 annual report 
700   $aHebner$b R. E., Jr$01410657
701   $aHebner$b R. E., Jr$01410657
701   $aJones$b T. B$0392067
701   $aKelley$b E. F$01410658
701   $aSudarshan$b T, S$01410659
701   $aThompson$b J. E$01410660
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710277303321
996   $a1980 annual report$93499829
997   $aUNINA