LEADER 01161nam 2200373 450 001 9910623983103321 005 20230822120613.0 010 $a1-4503-9285-7 035 $a(CKB)5700000000100560 035 $a(NjHacI)995700000000100560 035 $a(EXLCZ)995700000000100560 100 $a20230822d2022 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2022 IEEE/ACM International Workshop on Automated Program Repair (APR) /$fMaria Kechagia, [and three others] 210 1$aPiscataway, NJ :$cIEEE,$d2022. 215 $a1 online resource $cillustrations 311 $a1-66546-221-3 517 $a2022 IEEE/ACM International Workshop on Automated Program Repair 606 $aSoftware maintenance 606 $aDebugging in computer science 615 0$aSoftware maintenance. 615 0$aDebugging in computer science. 676 $a005.16 700 $aKechagia$b Maria$01383481 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a9910623983103321 996 $a2022 IEEE$93428377 997 $aUNINA LEADER 01446aam 2200409I 450 001 9910710267203321 005 20160121100809.0 024 8 $aGOVPUB-C13-d7ba52d7125713f2981af6686f1e91c1 035 $a(CKB)5470000002476613 035 $a(OCoLC)935500321 035 $a(EXLCZ)995470000002476613 100 $a20160121d1982 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aIntruder tagging and identification using luminescent particles /$fJ. R. DeVoe; R. A. Velapoldi; J. K. Langland; D. K. Hancock 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1982. 215 $a1 online resource 225 1 $aNBSIR ;$v81-2407 300 $a1982. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aDeVoe$b J. R$01402668 701 $aDeVoe$b J. R$01402668 701 $aHancock$b D. K$01407172 701 $aLangland$b J. K$01422274 701 $aVelapoldi$b R. A$01388165 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710267203321 996 $aIntruder tagging and identification using luminescent particles$93546006 997 $aUNINA