LEADER 01359aam  2200397I  450 
001 9910710225203321
005 20160309011337.0
024 8 $aGOVPUB-C13-84647b95c35d62872e19d496813f497a
035   $a(CKB)5470000002477037
035   $a(OCoLC)944188116
035   $a(EXLCZ)995470000002477037
100   $a20160309d1981      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMicroelectronic test patterns NBS-12 and NBS-24 /$fG. P. Carver; R. L. Mattis; M. G. Buehler
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1981.
215   $a1 online resource
225 1 $aNBSIR ;$v81-2234
300   $a1981.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aCarver$b G. P$01385516
701   $aBuehler$b M. G$01390314
701   $aCarver$b G. P$01385516
701   $aMattis$b Richard L$01390315
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710225203321
996   $aMicroelectronic test patterns NBS-12 and NBS-24$93442929
997   $aUNINA