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005 20160318082757.0
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035   $a(CKB)5470000002477147
035   $a(OCoLC)945070733
035   $a(EXLCZ)995470000002477147
100   $a20160318d1983      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$a1981 annual report $eoptical measurements for interfacial conduction and breakdown /$fR. E. Hebner Jr.; E. F. Kelley; J. N. Hagler
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1983.
215   $a1 online resource
225 1 $aNBSIR ;$v82-2629
300   $a1983.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $a1981 annual report 
700   $aHebner$b R. E., Jr$01410657
701   $aHagler$b J. N$01393538
701   $aHebner$b R. E., Jr$01410657
701   $aKelley$b E. F$01410658
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710214403321
996   $a1981 annual report$93532713
997   $aUNINA