LEADER 00679nam0-22002411i-450- 001 990002739950403321 035 $a000273995 035 $aFED01000273995 035 $a(Aleph)000273995FED01 035 $a000273995 100 $a20000920d1985----km-y0itay50------ba 101 0 $aENG 200 1 $a<>product abaudoument decision.$fby D.M . Lanbert. 210 $aCanada$cSoc. of Management Accountants$d1985 700 1$aLambert,$bDouglas M.$0107547 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990002739950403321 952 $a9-10-35-RA$b255$fECA 959 $aECA 996 $aProduct abaudoument decision$9425896 997 $aUNINA DB $aING01 LEADER 01229aam 2200373I 450 001 9910710210203321 005 20160318082757.0 024 8 $aGOVPUB-C13-488187ccf65591d014289002b07aedef 035 $a(CKB)5470000002477189 035 $a(OCoLC)945070866 035 $a(EXLCZ)995470000002477189 100 $a20160318d1983 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aDescription of CMOS test chip, NBS-39 /$fT. J. Russell 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1983. 215 $a1 online resource 225 1 $aNBSIR ;$v83-2683 300 $a1983. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aRussell$b T. J$01394901 701 $aRussell$b T. J$01394901 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710210203321 996 $aDescription of CMOS test chip, NBS-39$93458683 997 $aUNINA