LEADER 01229aam  2200373I  450 
001 9910710210203321
005 20160318082757.0
024 8 $aGOVPUB-C13-488187ccf65591d014289002b07aedef
035   $a(CKB)5470000002477189
035   $a(OCoLC)945070866
035   $a(EXLCZ)995470000002477189
100   $a20160318d1983      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aDescription of CMOS test chip, NBS-39 /$fT. J. Russell
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1983.
215   $a1 online resource
225 1 $aNBSIR ;$v83-2683
300   $a1983.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aRussell$b T. J$01394901
701   $aRussell$b T. J$01394901
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710210203321
996   $aDescription of CMOS test chip, NBS-39$93458683
997   $aUNINA