LEADER 01597aam  2200409I  450 
001 9910710078503321
005 20151118015321.0
024 8 $aGOVPUB-C13-8bdadc5d4b56f8aaca1e8ef7e73b251a
035   $a(CKB)5470000002475489
035   $a(OCoLC)929880733
035   $a(EXLCZ)995470000002475489
100   $a20151118d1973      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMeasurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons /$fJ. C. Humphreys; S. E. Chappell; W. L. McLaughlin; R. D. Jarrett
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1973.
215   $a1 online resource
225 1 $aNBSIR ;$v73-413
300   $a1973.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aHumphreys$b Jimmy C$01388364
701   $aChappell$b S. E.$f1931-2007.$01412637
701   $aHumphreys$b Jimmy C$01388364
701   $aJarrett$b R. D$01412638
701   $aMcLaughlin$b William L$01412639
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710078503321
996   $aMeasurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons$93506814
997   $aUNINA