LEADER 01375aam  2200385I  450 
001 9910710061103321
005 20151118015323.0
024 8 $aGOVPUB-C13-5b86526dd63e0f2f482cc4cf2d88b39a
035   $a(CKB)5470000002475665
035   $a(OCoLC)929881318
035   $a(EXLCZ)995470000002475665
100   $a20151118d1975      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMethod of testing for rating thermal storage devices based on thermal performance /$fGeorge E. Kelly; James E. Hill
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1975.
215   $a1 online resource
225 1 $aNBSIR ;$v74-634
300   $a1975.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aKelly$b George E$01387936
701   $aHill$b James E$021758
701   $aKelly$b George E$01387936
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710061103321
996   $aMethod of testing for rating thermal storage devices based on thermal performance$93502821
997   $aUNINA