LEADER 01404aam  2200397I  450 
001 9910710032603321
005 20151118015326.0
024 8 $aGOVPUB-C13-e97117b4a9cdc2b2860586e9b3439be8
035   $a(CKB)5470000002475953
035   $a(OCoLC)929882333
035   $a(EXLCZ)995470000002475953
100   $a20151118d1976      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aDevelopment of thin calibration standards for x-ray fluorescence analysis /$fP. A. Pella; E. C. Kuehner; W. A. Cassatt
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1976.
215   $a1 online resource
225 1 $aNBSIR ;$v75-970
300   $a1976.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aPella$b P. A$01390268
701   $aCassatt$b W. A$01404833
701   $aKuehner$b E. C$01404834
701   $aPella$b P. A$01390268
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710032603321
996   $aDevelopment of thin calibration standards for x-ray fluorescence analysis$93480182
997   $aUNINA