LEADER 01492aam  2200397I  450 
001 9910710030603321
005 20151118015326.0
024 8 $aGOVPUB-C13-6b39c06628bce67f5f0802dc163d48a3
035   $a(CKB)5470000002475973
035   $a(OCoLC)929882422
035   $a(EXLCZ)995470000002475973
100   $a20151118d1976      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 13$aAn analytical and experimental determination of the cutoff frequencies of higher-order TE modes in a TEM cell /$fJohn C. Tippet; David C. Chang; Myron L. Crawford
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1976.
215   $a1 online resource
225 1 $aNBSIR ;$v76-841
300   $a1976.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aTippet$b John C$01388189
701   $aChang$b David C$01388190
701   $aCrawford$b M. L$01389843
701   $aTippet$b John C$01388189
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710030603321
996   $aAn analytical and experimental determination of the cutoff frequencies of higher-order TE modes in a TEM cell$93480179
997   $aUNINA