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005 20151118015328.0
024 8 $aGOVPUB-C13-02e035ea3739c3501443d2dbebefe920
035   $a(CKB)5470000002476054
035   $a(OCoLC)929882674
035   $a(EXLCZ)995470000002476054
100   $a20151118d1976      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 12$aA micro-degradation model for paper /$fJeffrey T. Fong; Ronald G. Rehm; E. L. Graminski
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1976.
215   $a1 online resource
225 1 $aNBSIR ;$v76-1062
300   $a1976.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aFong$b Jeffrey T$0927726
701   $aFong$b Jeffrey T$0927726
701   $aGraminski$b E. L$01386937
701   $aRehm$b Ronald G$01386481
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710022603321
996   $aA micro-degradation model for paper$93462854
997   $aUNINA