LEADER 01263aam  2200373I  450 
001 9910710021903321
005 20151118015328.0
024 8 $aGOVPUB-C13-98f73c2e4204d40323f507d1232a30eb
035   $a(CKB)5470000002476061
035   $a(OCoLC)929882704
035   $a(EXLCZ)995470000002476061
100   $a20151118d1976      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 14$aThe structure of slow crack interfaces in silicon nitride /$fN. J. Tighe
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1976.
215   $a1 online resource
225 1 $aNBSIR ;$v76-1075
300   $a1976.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aTighe$b N. J$01387899
701   $aTighe$b N. J$01387899
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710021903321
996   $aThe structure of slow crack interfaces in silicon nitride$93438209
997   $aUNINA