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035   $a(CKB)5470000002476079
035   $a(OCoLC)929882790
035   $a(EXLCZ)995470000002476079
100   $a20151118d1976      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 14$aThe application of test structures and test patterns to the development of radiation hardened integrated circuits $ea review /$fK. F. Galloway; M. G. Buehler
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1976.
215   $a1 online resource
225 1 $aNBSIR ;$v76-1093
300   $a1976.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aApplication of test structures and test patterns to the development of radiation hardened integrated circuits 
700   $aGalloway$b K. F$01416333
701   $aBuehler$b M. G$01390314
701   $aGalloway$b K. F$01416333
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710020103321
996   $aThe application of test structures and test patterns to the development of radiation hardened integrated circuits$93542001
997   $aUNINA