LEADER 01414aam  2200385I  450 
001 9910710010303321
005 20151118015329.0
024 8 $aGOVPUB-C13-cafe9bacfb1017a86d094a72c3e73e92
035   $a(CKB)5470000002476178
035   $a(OCoLC)929883210
035   $a(EXLCZ)995470000002476178
100   $a20151118d1978      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aCentral-axis ııCO ionization measurements in graphite as a function of phantom diameter, depth, and field size /$fSteve R. Domen
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1978.
215   $a1 online resource
225 1 $aNBSIR ;$v77-1203
300   $a1978.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aCentral-axis p1
700   $aDomen$b Steve R$01387900
701   $aDomen$b Steve R$01387900
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710010303321
996   $aCentral-axis ııCO ionization measurements in graphite as a function of phantom diameter, depth, and field size$93491929
997   $aUNINA