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005 20151118015329.0
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035   $a(CKB)5470000002476185
035   $a(OCoLC)929883227
035   $a(EXLCZ)995470000002476185
100   $a20151118d1977      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aSome aspects of using a scanning electron microscope for total dose testing /$fK. F. Galloway; P. Roitman
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1977.
215   $a1 online resource
225 1 $aNBSIR ;$v77-1235
300   $a1977.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aGalloway$b K. F$01416333
701   $aGalloway$b K. F$01416333
701   $aRoitman$b P$01410262
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710009603321
996   $aSome aspects of using a scanning electron microscope for total dose testing$93521345
997   $aUNINA