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035   $a(OCoLC)929883413
035   $a(EXLCZ)995470000002476243
100   $a20151118d1977      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aEffect of flaw generation on proof-testing /$fS. M. Wiederhorn; N. J. Tighe
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1977.
215   $a1 online resource
225 1 $aNBSIR ;$v77-1408
300   $a1977.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aWiederhorn$b S. M$01118568
701   $aTighe$b N. J$01387899
701   $aWiederhorn$b S. M$01118568
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910710003903321
996   $aEffect of flaw generation on proof-testing$93544850
997   $aUNINA