LEADER 02215nam  2200529Ia 450 
001 9910709941303321
005 20180711120932.0
024 8 $aGOVPUB-C13-254a1864715c7982304eadbdcbd48eee
035   $a(CKB)5470000002474855
035   $a(OCoLC)894513332$z(OCoLC)894513317
035   $a(OCoLC)995470000002474855
035   $a(EXLCZ)995470000002474855
100   $a20141105d2014      uy             0
101 0 $aeng
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 02$aA proposed interim check for field testing a laser tracker's 3-D length measurement capability using a calibrated scale bar as a reference artifact /$fVincent D. Lee, Christopher Blackburn, Bala Muralikrishnan, Daniel Sawyer, Mark Meuret, Aaron Hudlemeyer
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2014.
215   $a1 online resource (12 pages) $cillustrations (some color)
225 1 $aNISTIR ;$v8016
300   $a"September 2014."
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page (viewed October 1, 2014).
320   $aIncludes bibliographical references.
606   $aLaser tracker
606   $aLength measurement
606   $aLength measurement$2fast
615  0$aLaser tracker.
615  0$aLength measurement.
615  7$aLength measurement.
701   $aBlackburn$b Christopher$01416952
701   $aHudlemeyer$b Aaron$01416953
701   $aLee$b Vincent D$085474
701   $aMeruet$b Mark$01416954
701   $aMuralikrishnan$b Bala$01416955
701   $aSawyer$b Daniel$01416956
712 02$aPhysical Measurement Laboratory (National Institute of Standards and Technology (U.S.)).$bSemiconductor and Dimensional Metrology Division.
801  0$bNBS
801  1$bNBS
801  2$bOCLCO
801  2$bOCLCQ
801  2$bOCLCF
906   $aBOOK
912   $a9910709941303321
996   $aA proposed interim check for field testing a laser tracker's 3-D length measurement capability using a calibrated scale bar as a reference artifact$93523927
997   $aUNINA