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035   $a(OCoLC)929879084
035   $a(EXLCZ)995470000002475122
100   $a20151118d1978      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMeasurement techniques for high power semiconductor materials and devices $eAnnual report, January 1, to December 31, 1977 /$fF. F. Oettinger
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1978.
215   $a1 online resource
225 1 $aNBSIR ;$v78-1474
300   $a1978.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aMeasurement techniques for high power semiconductor materials and devices 
700   $aOettinger$b F. F$01386490
701   $aOettinger$b F. F$01386490
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709914803321
996   $aMeasurement techniques for high power semiconductor materials and devices$93435445
997   $aUNINA