LEADER 01500aam  2200385I  450 
001 9910709909403321
005 20151118015317.0
024 8 $aGOVPUB-C13-6fcfe8c86940d4c1aa3c64b04d1b39f0
035   $a(CKB)5470000002475177
035   $a(OCoLC)929879295
035   $a(EXLCZ)995470000002475177
100   $a20151118d1979      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 12$aA variational expression for the scattering matrix of a coaxial line step discontinuity and its application to an over moded coaxial TEM cell /$fI. Sreenivasiah; David C. Chang
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1979.
215   $a1 online resource
225 1 $aNBSIR ;$v79-1606
300   $a1979.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aSreenivasiah$b I$01392755
701   $aChang$b David C$01388190
701   $aSreenivasiah$b I$01392755
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709909403321
996   $aA variational expression for the scattering matrix of a coaxial line step discontinuity and its application to an over moded coaxial TEM cell$93447995
997   $aUNINA