LEADER 02217oam  2200625I  450 
001 9910709716503321
005 20180828110937.0
035   $a(CKB)5470000002473085
035   $a(OCoLC)761309631
035   $a(OCoLC)995470000002473085
035   $a(EXLCZ)995470000002473085
100   $a20111115j198602    ua             0
101 0 $aeng
135   $aurun||||a|a||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aProgrammable, automated transistor test system /$fLong V. Truong and Gale R. Sundburg
210  1$aWashington, D.C. :$cNational Aeronautics and Space Administration, Scientific and Technical Information Branch,$dFebruary 1986.
215   $a1 online resource (22 pages) $cillustrations
225 1 $aNASA/TP ;$v2554
300   $a"February 1986."
320   $aIncludes bibliographical references (page 22).
606   $aBipolar transistors$2nasat
606   $aPerformance tests$2nasat
606   $aField effect transistors$2nasat
606   $aNumerical control$2nasat
606   $aSoftware engineering$2nasat
606   $aTransistors$xTesting$xComputer programs
606   $aBipolar transistors$xTesting$xComputer programs
606   $aMetal oxide semiconductors$xTesting$xComputer programs
615  7$aBipolar transistors.
615  7$aPerformance tests.
615  7$aField effect transistors.
615  7$aNumerical control.
615  7$aSoftware engineering.
615  0$aTransistors$xTesting$xComputer programs.
615  0$aBipolar transistors$xTesting$xComputer programs.
615  0$aMetal oxide semiconductors$xTesting$xComputer programs.
700   $aTruong$b Long V.$01411547
702   $aSundberg$b Gale R.
712 02$aUnited States.$bNational Aeronautics and Space Administration.$bScientific and Technical Information Branch,
712 02$aLewis Research Center.
801  0$bOCLCE
801  1$bOCLCE
801  2$bOCLCQ
801  2$bOCLCO
801  2$bOCLCQ
801  2$bGPO
801  2$bMERUC
801  2$bGPO
906   $aBOOK
912   $a9910709716503321
996   $aProgrammable, automated transistor test system$93503075
997   $aUNINA