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100   $a20160620d2011      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aReport on VAMAS round robin of ISO 13067 $emicrobeam analysis - electron backscatter diffraction - measurement of average grain size /$fAdam Creuziger; Mark Vaudin
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2011.
215   $a1 online resource
225 1 $aNISTIR ;$v7814
300   $a2011.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page (viewed December 31, 2015).
320   $aIncludes bibliographical references.
517   $aReport on VAMAS round robin of ISO 13067 
700   $aCreuziger$b Adam$01412245
701   $aCreuziger$b Adam$01412245
701   $aVaudin$b Mark$01412246
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709597203321
996   $aReport on VAMAS round robin of ISO 13067$93505220
997   $aUNINA