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100   $a20140902d2014      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 02$aA measurement metric for forensic latent fingerprint preprocessing /$fHaiying Guan; Andrew Dienstfrey; Mary Theofanos; Brian Stanton
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2014.
215   $a1 online resource (42 pages) $cillustrations (black and white)
225 1 $aNISTIR ;$v8017
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aJuly 2014.
300   $aTitle from PDF title page (viewed July 23, 2014).
320   $aIncludes bibliographical references.
606   $aFingerprints
615  0$aFingerprints.
701   $aDienstfrey$b Andrew$01412243
701   $aGuan$b Haiying$01412244
701   $aStanton$b Brian$01388780
701   $aTheofanos$b Mary$01388783
712 02$aNational Institute of Standards and Technology (U.S.).$bInformation Technology Laboratory, Material Measurement Laboratory.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709590403321
996   $aA measurement metric for forensic latent fingerprint preprocessing$93505216
997   $aUNINA