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035   $a(OCoLC)926748639
035   $a(EXLCZ)995470000002479364
100   $a20151026d1992      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aStandard reference materials $eantireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems /$fCarol F. Vezzetti, Ruth N. Varner
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1992.
215   $a1 online resource
225 1 $aNIST special publication ;$v260-117
300   $a1992.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aStandard reference materials 
700   $aVezzetti$b Carol F$01388407
701   $aVarner$b Ruth N$01388408
701   $aVezzetti$b Carol F$01388407
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709563603321
996   $aStandard reference materials$93438962
997   $aUNINA