LEADER 01504aam  2200409I  450 
001 9910709562103321
005 20151026040613.0
024 8 $aGOVPUB-C13-b5853f01a8611870afa1bea5c01d5d84
035   $a(CKB)5470000002479379
035   $a(OCoLC)926748685
035   $a(EXLCZ)995470000002479379
100   $a20151026d1995      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 00$aStandard reference materials $epolystyrene films for calibrating the wavelength scale of infrared spectrophotometers - SRM 1921 /$fDevinder Gupta, Lan Wang, Jack J. Hsia, Raju U. Datla
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1995.
215   $a1 online resource
225 1 $aNIST special publication ;$v260-122
300   $a1995.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aStandard reference materials 
701   $aDatla$b Raju Umapathi$01388404
701   $aGupta$b Devinder$01391865
701   $aHsia$b J. J$01391866
701   $aWang$b Lan$0868611
712 02$aNational Institute of Standards and Technology (U.S.)
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709562103321
996   $aStandard reference materials$93445956
997   $aUNINA