LEADER 01438aam  2200397I  450 
001 9910709539103321
005 20151026025815.0
024 8 $aGOVPUB-C13-04d117ebc13007bdcb283045abc65d24
035   $a(CKB)5470000002479611
035   $a(OCoLC)926739933
035   $a(EXLCZ)995470000002479611
100   $a20151026d1965      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aStandard reference materials $eaccuracy of solution x-ray spectrometric analysis of copper-base alloys/$fRobert Alvarez, Richard Flitsch
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1965.
215   $a1 online resource
225 1 $aNational Bureau of Standards miscellaneous publication ;$v260-5
300   $a1965.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
517   $aStandard reference materials 
700   $aAlvarez$b Robert$099666
701   $aAlvarez$b Robert$099666
701   $aFlitsch$b Richard$01411860
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709539103321
996   $aStandard reference materials$93503982
997   $aUNINA