LEADER 01971aam  2200385I  450 
001 9910709510103321
005 20151026025822.0
024 8 $aGOVPUB-C13-f99c5ebb4166d4b7a5cc0d059fe7836b
035   $a(CKB)5470000002479904
035   $a(OCoLC)926742703
035   $a(EXLCZ)995470000002479904
100   $a20151026d1985      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aDigital methods in waveform metrology /$fBarry A. Bell
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1985.
215   $a1 online resource
225 1 $aNBS special publication ;$v707
300   $a1985.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
330 3 $aThe special publication contains complete papers on the subjects presented at the seminar, providing more of the technical details. For the sessions on Precisioin Waveform Synthesis, Precision Waveform Sampling, and Data Converter Characterization, six formal papers are given describing the hardware and software techniques used for developing NBS laboratory standards and apparatus for testing ac sources and voltmeters, phase angle meters, transient waveform recorders, wideband wattmeters, and digital-to-analog and analog-to-digital converters. For the informal session on Instrumentation Metrology, three subsequent papers have been written for publication which are included for completeness in the Appendices.
700   $aBell$b B. A$01402445
701   $aBell$b B. A$01402445
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709510103321
996   $aDigital methods in waveform metrology$93472931
997   $aUNINA