LEADER 01348aam  2200385I  450 
001 9910709504603321
005 20151030113006.0
024 8 $aGOVPUB-C13-4e11f729adddce431e39509fca40a132
035   $a(CKB)5470000002479960
035   $a(OCoLC)927169560
035   $a(EXLCZ)995470000002479960
100   $a20151030d1985      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMOS1 a program for two-dimensional analysis of Si MOSFETs /$fCharles L. Wilson, James L. Blue
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1985.
215   $a1 online resource
225 1 $aNBS special publication ;$v400-77
300   $a1985.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aWilson$b Charles L$0282177
701   $aBlue$b J. L$01400390
701   $aWilson$b Charles L$0282177
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709504603321
996   $aMOS1 a program for two-dimensional analysis of Si MOSFETs$93490059
997   $aUNINA