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035   $a(CKB)5470000002479984
035   $a(OCoLC)927169481
035   $a(EXLCZ)995470000002479984
100   $a20151030d1977      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aWorkshop on standards for image pattern recognition /$fJohn M. Evans Jr., Russell Kirsch, Roger N. Nagel
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1977.
215   $a1 online resource
225 1 $aNBS special publication ;$v500-8
300   $a1977.
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aTitle from PDF title page.
320   $aIncludes bibliographical references.
700   $aEvans$b John M., Jr$099332
701   $aEvans$b John M., Jr$099332
701   $aKirsch$b Russell A$01388969
701   $aNagel$b Roger N$01388970
712 02$aUnited States.$bNational Bureau of Standards.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709502203321
996   $aWorkshop on standards for image pattern recognition$93440059
997   $aUNINA