LEADER 02018nam  2200529   450 
001 9910706280303321
005 20171005081534.0
035   $a(CKB)5470000002455631
035   $a(OCoLC)1005351036
035   $a(EXLCZ)995470000002455631
100   $a20171005j199912    ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 14$aThe effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling /$fMarek-Jerzy Pindera, Jacob Aboudi, Steven M. Arnold
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$dDecember 1999.
215   $a1 online resource (16 pages) $cillustrations
225 1 $aNASA/TM ;$v2000-209770
300   $a"December 1999."
300   $a"Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field"--Report documentation page.
320   $aIncludes bibliographical references (pages 16-17).
606   $aInterfaces$2nasat
606   $aOxide films$2nasat
606   $aThickness$2nasat
606   $aSurface roughness$2nasat
606   $aTemperature effects$2nasat
606   $aStress distribution$2nasat
606   $aFilm thickness$2nasat
615  7$aInterfaces.
615  7$aOxide films.
615  7$aThickness.
615  7$aSurface roughness.
615  7$aTemperature effects.
615  7$aStress distribution.
615  7$aFilm thickness.
700   $aPindera$b M.-J$g(Marek-Jerzy),$f1951-$0544147
702   $aAboudi$b Jacob$f1935-
702   $aArnold$b S. M.
712 02$aNASA Glenn Research Center,
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910706280303321
996   $aThe effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling$93504919
997   $aUNINA