LEADER 01735nam 2200433Ia 450 001 996389884203316 005 20210104172043.0 035 $a(CKB)4940000000095566 035 $a(EEBO)2264210713 035 $a(OCoLC)ocn811765195e 035 $a(OCoLC)811765195 035 $a(EXLCZ)994940000000095566 100 $a20121003d1601 uy 0 101 0 $aeng 135 $aurbn||||a|bb| 200 12$aA dialogue betwixt a secular priest, and a lay gentleman$b[electronic resource] $eBeing an abstract of the most important matters that are in controuersie betwixt the priests and the Spanish or Iesuiticall faction 210 $aPrinted at Rhemes [i.e. London $cBy Adam Islip]$dMDCI. [1601] 215 $a[22], 134 p 300 $aEditor's preface signed: W.W., i.e. William Watson. 300 $aPreface by Watson; main text by J. Mush. Cf. STC (2nd ed.). 300 $aActual place of publication and printer's name suggested by STC (2nd ed.). 300 $aPrinter's ornament on t.p.; headpieces; tailpiece; initials. 300 $aSignatures: [asterisk]? 2[asterisk]? A-S?. 330 $aeebo-0216 606 $aArchpriest controversy, 1598-1602$vSources$vEarly works to 1800 606 $aCatholics$zEngland$vEarly works to 1800 606 $aChurch and state$zEngland$vEarly works to 1800 615 0$aArchpriest controversy, 1598-1602 615 0$aCatholics 615 0$aChurch and state 700 $aMush$b John$01007513 702 $aWatson$b William$f1559?-1603, 702 $aIslip$b Adam$fd. 1639, 801 0$bUMI 801 1$bUMI 906 $aBOOK 912 $a996389884203316 996 $aA dialogue betwixt a secular priest, and a lay gentleman$92383286 997 $aUNISA LEADER 01887oam 2200553 450 001 9910709895603321 005 20180828112136.0 035 $a(CKB)5470000002473296 035 $a(OCoLC)1045068354 035 $a(OCoLC)995470000002473296 035 $a(EXLCZ)995470000002473296 100 $a20180720j198609 ua 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aShuttle/spacelab contamination environment and effects handbook /$fL.E. Bareiss, R.M. Payton, and H.A. Papazian 210 1$aWashington, D.C. :$cNational Aeronautics and Space Administration, Scientific and Technical Information Branch,$dSeptember 1986. 215 $a1 online resource (various pagings) $cillustrations 225 1 $aNASA/CR ;$v3993 300 $a"September 1986." 300 $a"Martin Marietta Aerospace Denver Division." 320 $aIncludes bibliographical references. 606 $aSpacecraft contamination$2nasat 606 $aSpace transportation system$2nasat 606 $aSpacelab$2nasat 606 $aSpace flight$2nasat 606 $aUser requirements$2nasat 615 7$aSpacecraft contamination. 615 7$aSpace transportation system. 615 7$aSpacelab. 615 7$aSpace flight. 615 7$aUser requirements. 700 $aBareiss$b L. E.$01415801 702 $aPayton$b R. M. 702 $aPapazian$b H. A. 712 02$aUnited States.$bNational Aeronautics and Space Administration.$bScientific and Technical Information Branch, 712 02$aMartin Marietta Denver Aerospace. 712 02$aGeorge C. Marshall Space Flight Center. 801 0$bGPO 801 1$bGPO 801 2$bGPO 801 2$bMERUC 801 2$bGPO 906 $aBOOK 912 $a9910709895603321 996 $aShuttle$93518888 997 $aUNINA LEADER 02270oam 2200577I 450 001 9910706231503321 005 20171025104341.0 035 $a(CKB)5470000002456124 035 $a(OCoLC)858263039 035 $a(EXLCZ)995470000002456124 100 $a20130912j200002 ua 0 101 0 $aeng 135 $aurbn||||a|a|| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aCorrelation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes /$fC.M. Schnabel [and six others] 210 1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$dFebruary 2000. 215 $a1 online resource (4 pages) $cillustrations 225 1 $aNASA/TM ;$v2000-209648 300 $a"February 2000." 300 $a"Prepared for the 1999 International Conference on Silicon Carbide and Related Materials sponsored by North Carolina State University, Raleigh, North Carolina, October 10-15, 1999." 300 $a"Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field"--Report documentation page. 320 $aIncludes bibliographical references (page 4). 517 3 $aCorrelation of electron-beam-induced current and synchrotron white-beam X-ray topography imaged defects and epilayer growth pits in 6H-SiC Schottky diodes 606 $aCorrelation$2nasat 606 $aSynchrotrons$2nasat 606 $aTopography$2nasat 606 $aBeam currents$2nasat 606 $aElectron beams$2nasat 606 $aSchottky diodes$2nasat 606 $aCrystal defects$2nasat 615 7$aCorrelation. 615 7$aSynchrotrons. 615 7$aTopography. 615 7$aBeam currents. 615 7$aElectron beams. 615 7$aSchottky diodes. 615 7$aCrystal defects. 700 $aSchnabel$b C. M.$01403200 712 02$aNASA Glenn Research Center, 801 0$bOCLCE 801 1$bOCLCE 801 2$bOCLCO 801 2$bOCLCF 801 2$bOCLCQ 801 2$bGPO 906 $aBOOK 912 $a9910706231503321 996 $aCorrelation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes$93475353 997 $aUNINA