LEADER 01786oam 2200493I 450 001 9910706222603321 005 20171030112619.0 035 $a(CKB)5470000002456214 035 $a(OCoLC)858279939 035 $a(EXLCZ)995470000002456214 100 $a20130912j200001 ua 0 101 0 $aeng 135 $aurbn||||a|a|| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 14$aThe influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber /$fJay J. Ely, Truong X. Nguyen, Stephen A. Scearce 210 1$aHampton, Virginia :$cNational Aeronautics and Space Administration, Langley Research Center,$dJanuary 2000. 215 $a1 online resource (12 pages) $cillustrations 225 1 $aNASA/TM ;$v2000-209844 300 $a"January 2000." 300 $a"Performing organization: NASA Langley Research Center"--Report documentation page. 320 $aIncludes bibliographical references (pages 11-12). 606 $aField tests$2nasat 606 $aService life$2nasat 606 $aField strength$2nasat 606 $aElectromagnetic compatibility$2nasat 615 7$aField tests. 615 7$aService life. 615 7$aField strength. 615 7$aElectromagnetic compatibility. 700 $aEly$b Jay J.$01414061 702 $aNguyen$b Truong X.$f1965- 702 $aScearce$b Stephen A. 712 02$aLangley Research Center, 801 0$bOCLCE 801 1$bOCLCE 801 2$bOCLCO 801 2$bOCLCQ 801 2$bGPO 906 $aBOOK 912 $a9910706222603321 996 $aThe influence of modulated signal risetime in flight electronics radiated immunity testing with a mode-stirred chamber$93532352 997 $aUNINA