LEADER 01299nam a2200301 i 4500
001 991003701379707536
005 20021220115406.0
008 020411s2001    sz            ||| | eng  
020   $a3764361255 (alk. paper)
035   $ab11850231-39ule_inst
035   $aLE01313650$9ExL
040   $aDip.to Matematica$beng
082 0 $a515.353
084   $aAMS 65M
100 1 $aKreiss, Heinz-Otto$0447999
245 10$aTime-dependent partial differential equations and their numerical solution /$cHeinz-Otto Kreiss, Hedwig Ulmer Busenhart
260   $aBasel ; Boston ; Berlin :$bBirkhauser,$cc2001
300   $avi, 82 p. :$bill. ;$c25 cm.
490 0 $aLectures in mathematics ETH Zurich
500   $aIncludes bibliographical references (p. [79]) and index
650  0$aPartial differential equations-numerical solutions
700 1 $aBusenhart, Hedwig Ulmer$eauthor$4http://id.loc.gov/vocabulary/relators/aut$0736155
907   $a.b11850231$b28-04-17$c20-12-02
912   $a991003701379707536
945   $aLE013 65M KRE11 (2001)$g1$i2013000133973$lle013$o-$pE0.00$q-$rl$s-  $t0$u0$v0$w0$x0$y.i12102817$z20-12-02
996   $aTime-dependent partial differential equations and their numerical solution$91454597
997   $aUNISALENTO
998   $ale013$b01-01-02$cm$da  $e-$feng$gsz $h0$i1

LEADER 01849nam  2200517   450 
001 9910705874403321
005 20170725143054.0
035   $a(CKB)5470000002453671
035   $a(OCoLC)994303469
035   $a(EXLCZ)995470000002453671
100   $a20170724d1990      ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aElectron beam induced damage in PECVD Si?N? and SiO? films on InP /$fDragan M. Pantie [and four others]
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Lewis Research Center,$d[1990].
215   $a1 online resource (15 pages) $cillustrations
225 1 $aNASA technical memorandum ;$v102544
300   $a"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.
320   $aIncludes bibliographical references (page 13).
606   $aCapacitance-voltage characteristics$2nasat
606   $aElectron beams$2nasat
606   $aIndium phosphides$2nasat
606   $aIrradiation$2nasat
606   $aPhosphorus$2nasat
606   $aPlasmas (physics)$2nasat
606   $aRadiation damage$2nasat
606   $aVapor deposition$2nasat
615  7$aCapacitance-voltage characteristics.
615  7$aElectron beams.
615  7$aIndium phosphides.
615  7$aIrradiation.
615  7$aPhosphorus.
615  7$aPlasmas (physics)
615  7$aRadiation damage.
615  7$aVapor deposition.
700   $aPantic$b Dragan M.$01414978
712 02$aLewis Research Center,
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910705874403321
996   $aElectron beam induced damage in PECVD Si?N? and SiO? films on InP$93515740
997   $aUNINA