LEADER 01994nam  2200517   450 
001 9910705840803321
005 20170802143201.0
035   $a(CKB)5470000002454010
035   $a(OCoLC)998837503
035   $a(EXLCZ)995470000002454010
100   $a20170802j199808    ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aPerformance of surface-mount ceramic and solid tantalum capacitors for cryogenic applications /$fAhmad Hammoud [and three others]
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Lewis Research Center,$dAugust 1998.
215   $a1 online resource (5 pages) $cillustrations
225 1 $aNASA/TM ;$v1998-208489
300   $a"August 1998."
300   $a"Prepared for the Electrical Insulation and Dielectric Phenomena sponsored by the Institute of Electrical and Electronics Engineers, Atlanta, Georgia, October 25-28, 1998."
300   $a"Performing organization: National Aeronautics and Space Administration, Lewis Research Center"--Report documentation page.
320   $aIncludes bibliographical references (page 5).
606   $aCapacitors$2nasat
606   $aCryogenics$2nasat
606   $aLow temperature$2nasat
606   $aLiquid nitrogen$2nasat
606   $aDielectric properties$2nasat
606   $aCommunication satellites$2nasat
606   $aCeramics$2nasat
615  7$aCapacitors.
615  7$aCryogenics.
615  7$aLow temperature.
615  7$aLiquid nitrogen.
615  7$aDielectric properties.
615  7$aCommunication satellites.
615  7$aCeramics.
700   $aHammoud$b Ahmad N.$01404498
712 02$aLewis Research Center,
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910705840803321
996   $aPerformance of surface-mount ceramic and solid tantalum capacitors for cryogenic applications$93533873
997   $aUNINA