LEADER 01679nam 2200421 450 001 9910705626303321 005 20170908152619.0 035 $a(CKB)5470000002452136 035 $a(OCoLC)988028658 035 $a(EXLCZ)995470000002452136 100 $a20170525j200302 ua 0 101 0 $aeng 135 $aurbn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aBasic equations for the modeling of gallium nitride (GaN) high electron mobility transistors (HEMTs) /$fJon C. Freeman 210 1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$dFebruary 2003. 215 $a1 online resource (65 pages) $cillustrations 225 1 $aNASA/TM ;$v2003-211983 300 $a"February 2003." 300 $a"Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field" Report documentation page. 320 $aIncludes bibliographical references (pages 62-65). 517 $aBasic equations for the modeling of gallium nitride 606 $aGallium nitrides$2nasat 606 $aField effect transistors$2nasat 606 $aHigh electron mobility transistors$2nasat 615 7$aGallium nitrides. 615 7$aField effect transistors. 615 7$aHigh electron mobility transistors. 700 $aFreeman$b Jon C.$01402341 712 02$aNASA Glenn Research Center, 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910705626303321 996 $aBasic equations for the modeling of gallium nitride (GaN) high electron mobility transistors (HEMTs)$93537876 997 $aUNINA