LEADER 01648nam  2200469   450 
001 9910705401503321
005 20170428132801.0
035   $a(CKB)5470000002451377
035   $a(OCoLC)984751376
035   $a(EXLCZ)995470000002451377
100   $a20170428j200207    ua             0
101 0 $aeng
135   $aurbn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aSurface characterization techniques: an overview /$fKazuhisa Miyoshi
210  1$aCleveland Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$dJuly 2002.
215   $a1 online resource (iii, 45 pages) $cillustrations
225 1 $aNASA/TM ;$v2002-211497
300   $a"July 2002."
300   $a"Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field" Report documentation page.
320   $aIncludes bibliographical references (pages 42-45).
517   $aSurface characterization techniques
606   $aThin films$2nasat
606   $aTribology$2nasat
606   $aSurface properties$2nasat
606   $aChemical properties$2nasat
606   $aMechanical properties$2nasat
615  7$aThin films.
615  7$aTribology.
615  7$aSurface properties.
615  7$aChemical properties.
615  7$aMechanical properties.
700   $aMiyoshi$b Kazuhisa$01389374
712 02$aNASA Glenn Research Center,
801  0$bGPO
801  1$bGPO
906   $aBOOK
912   $a9910705401503321
996   $aSurface characterization techniques: an overview$93478550
997   $aUNINA